SPECIAL ISSUE - SELECTED PAPERS FROM THE 1989 INTERNATIONAL TEST CONFERENCE

被引：0

作者：

RAJSKI, J ^{[1
]}

SILBERMAN, GM ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,VLSI ARCHITECTURES GRP,YORKTOWN HTS,NY 10598

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1992年 / 11卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

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页码：2 / 3

页数：2

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