MEASURING OF LIFETIME FOR MINOR CHARGE CARRIERS IN HIGH-RESISTANT SEMICONDUCTOR SAMPLES BY MEANS OF PROBE METHOD

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作者：

KONKOV, VL

POLYAKOV, NN

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IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA | 1971年 / 09期

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O4 [物理学];

学科分类号：

0702 ;

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页码：156 / &

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