ELECTRONIC DEVICE FOR THE ANALYSIS OF ELECTRON-DIFFRACTION PATTERNS

被引：2

作者：

TRZYNKA, A

TAKEO, M

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 03期

关键词：

D O I：

10.1063/1.1140255

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：434 / 437

页数：4

共 50 条

[1] ANALYSIS OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
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[J]. JOURNAL OF ELECTRON MICROSCOPY, 1986, 35 (01): : 82 - 82
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[3] THE APPLICATION OF THE THEORETICAL DIFFRACTION PATTERNS FOR THE ELECTRON-DIFFRACTION ANALYSIS OF THE METALLIC MATERIALS
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[4] THE MODERN SYSTEM OF ELECTRON-DIFFRACTION TECHNIQUES AND ELECTRON-DIFFRACTION ANALYSIS
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[6] MULTICHANNEL MICRODENSITOMETRY FOR ELECTRON-DIFFRACTION PATTERNS
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[7] REFLEXION INTENSITIES OF ELECTRON-DIFFRACTION PATTERNS
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[8] ELECTRON-DIFFRACTION PATTERNS FROM COBALT
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[10] SYMMETRY OF SLOW ELECTRON-DIFFRACTION PATTERNS
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