HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS IN A B2-TYPE INTERMETALLIC COMPOUND COTI

被引:13
|
作者
SHINDO, D
YOSHIDA, M
LEE, BT
TAKASUGI, T
HIRAGA, K
机构
[1] MIYAGI NATL COLL TECHNOL,NATORI,MIYAGI 98112,JAPAN
[2] TOHOKU UNIV,INST MAT RES,SENDAI,MIYAGI 980,JAPAN
关键词
HIGH-RESOLUTION ELECTRON MICROSCOPY; COTI; B2-TYPE STRUCTURE; CORE SPREADING; YIELD STRESS;
D O I
10.1016/0966-9795(95)92682-P
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Core structures of edge and screw dislocations in CoTi were studied by high-resolution electron microscopy (HREM). An HREM image of an edge dislocation showed that the spreading of the dislocation core was limited within a distance of about 1.2 nm. From an HREM image of screw dislocations in CoTi, it was shown that the core was spreading on the (010) plane and the spreading of the core was limited within a distance of about 1.8 nm. It was suggested that the core spreading on the {010} plane, which was different from the slip plane of {110}, affected the abnormal temperature dependence of yield stress of CoTi.
引用
收藏
页码:167 / 171
页数:5
相关论文
共 50 条
  • [1] Computational Investigation of Thermodynamic and Mechanical Properties of B2-type CoTi Intermetallic Compound
    N. Bioud
    N. Benchiheub
    A. Benamrani
    M. A. Ghebouli
    M. Fatmi
    Faisal Katib Alanazi
    Physics of the Solid State, 2025, 67 (1) : 68 - 74
  • [2] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS OF MGO
    OHTA, J
    SUZUKI, K
    SUZUKI, T
    JOURNAL OF MATERIALS RESEARCH, 1994, 9 (11) : 2953 - 2958
  • [3] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS AND INTERFACES IN SEMICONDUCTORS
    OLSEN, A
    SPENCE, JCH
    ULTRAMICROSCOPY, 1981, 6 (04) : 416 - 416
  • [4] CHARACTERIZATION OF COMPOUND SEMICONDUCTORS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SMITH, DJ
    LU, P
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1991, (117): : 1 - 10
  • [5] DISSOCIATED DISLOCATIONS IN GAAS OBSERVED IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    TANAKA, M
    JOUFFREY, B
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 50 (06): : 733 - 743
  • [6] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
    OKEEFE, MA
    ULTRAMICROSCOPY, 1992, 47 (1-3) : 282 - 297
  • [7] HIGH-RESOLUTION ELECTRON-MICROSCOPY
    COWLEY, JM
    ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1987, 38 : 57 - 88
  • [8] HIGH-RESOLUTION ELECTRON-MICROSCOPY
    HASHIMOTO, H
    ULTRAMICROSCOPY, 1984, 12 (1-2) : 90 - 90
  • [9] HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SMITH, DJ
    HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 463 - 477
  • [10] OBSERVATIONS OF DISLOCATIONS IN WHITE TIN USING HIGH-RESOLUTION ELECTRON-MICROSCOPY
    OJIMA, K
    TANEDA, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (04): : L496 - L498