TECHNIQUES FOR RELIABILITY ASSESSMENT FROM FIELD DATA

被引：0
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作者：
METCALFE, V
ADAMS, HC
机构：
来源：
MICROELECTRONICS RELIABILITY | 1970年 / 9卷 / 02期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：102 / &
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