On the silica replica method of surface examination with the electron microscope

被引：2

作者：

Baker, RF ^{[1
]}

Nicoll, FH ^{[1
]}

机构：

[1] RCA Labs, Princeton, NJ USA

来源：

JOURNAL OF APPLIED PHYSICS | 1944年 / 15卷 / 12期

关键词：

D O I：

10.1063/1.1707394

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：803 / 805

页数：3

共 50 条

[1] REPLICA TECHNIQUE FOR SYSTEMATIC EXAMINATION OF A SURFACE UNDER THE ELECTRON MICROSCOPE
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