MODELING OF JUNCTION CAPACITANCES OF GRADED BASE HETEROJUNCTION BIPOLAR-TRANSISTORS

被引:6
|
作者
RYUM, BR
ABDELMOTALEB, IM
机构
[1] NORTHWESTERN UNIV, DEPT ELECT ENGN, EVANSTON, IL 60208 USA
[2] NORTHWESTERN UNIV, DEPT COMP SCI, EVANSTON, IL 60208 USA
关键词
D O I
10.1016/0038-1101(91)90151-N
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Capacitance models for emitter-base and collector-base junctions of graded base heterojunction bipolar transistors (HBTs) are developed. Effects of base grading on potential barriers, space-charge region (SCR) boundaries, and emitter-base and collector-base junction capacitances are investigated. The emitter-base capacitance is divided into depletion capacitance and capacitance resulting from the mobile carriers in the SCR. To obtain a closed-form solution for the capacitance, intrinsic potential is assumed to be piecewise linear. For the collector-base capacitance, depletion approximation is employed, since the junction is usually reverse-biased in normal operation. It is demonstrated that the present model is quite consistent with the measured data.
引用
收藏
页码:481 / 488
页数:8
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