DERATING WIREWOUND POWER RESISTORS

被引：0
|
作者：
GANCI, C
LITTLEJOHN, HF
WAYNE, B
CULLY, JO
机构：
来源：
ELECTRONIC PRODUCTS MAGAZINE | 1982年 / 25卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：64 / 66
页数：3
相关论文
共 50 条
  • [1] WIREWOUND PRECISION AND POWER RESISTORS
    KAMPMEYER, R
    ELECTRONIC DESIGN, 1978, 26 (09) : 124 - 128
  • [2] KEEP COOL WHEN IT COMES TO POWER WIREWOUND RESISTORS
    KAMPMEYER, R
    ELECTRONIC PRODUCTS MAGAZINE, 1977, 20 (05): : 59 - 62
  • [3] NOTE ON DERATING-RESISTORS CLINIC
    EDDINGTON, SR
    RADIO-ELECTRONICS, 1983, 54 (05): : 100 - 100
  • [4] WIREWOUND RESISTORS OFFER BUILT-IN CIRCUIT PROTECTION
    SANDONE, F
    HARTLEY, J
    ELECTRONIC PRODUCTS MAGAZINE, 1973, 16 (06): : 153 - &
  • [5] Fail-safe wirewound resistors for robust applications
    Schroeder, Kory
    Power Electronics Technology, 2010, 36 (10): : 41 - 43
  • [6] WIREWOUND RESISTORS OF HIGH-PRECISION IN PROCESS-CONTROL
    BROWN, P
    CONTROL AND INSTRUMENTATION, 1981, 13 (02): : 43 - &
  • [7] WIREWOUND RESISTORS AS ELEMENTS IN HIGH-VOLTAGE ENGINEERING AND COMPUTER ENGINEERING
    MINKNER, R
    MESSTECHNIK, 1969, 77 (04): : 101 - &
  • [8] High-temperature storage and thermal cycling studies of Heraeus-Cermalloy thick film and Dale power wirewound resistors
    Naefe, JE
    Johnson, RW
    Grzybowski, RR
    1998 FOURTH INTERNATIONAL HIGH TEMPERATURE ELECTRONICS CONFERENCE, 1998, : 191 - 206
  • [9] High-temperature storage and thermal cycling studies of thick film and wirewound resistors
    Naefe, JE
    Johnson, RW
    Grzybowski, RR
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2002, 25 (01): : 45 - 52
  • [10] Modeling Capacitor Derating in Power Integrity Simulation
    Lu, Tianjian
    Wu, Ken
    Yang, Zhiping
    Jin, Jian-Ming
    2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & SIGNAL/POWER INTEGRITY (EMCSI), 2017, : 567 - 572
12345