MINIMIZING SAMPLING ERROR IN TRANSMISSION ELECTRON-MICROSCOPY

被引：3

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作者：

LEWIN, JF

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 122卷 / APR期

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D O I：

10.1111/j.1365-2818.1981.tb01247.x

中图分类号：

TH742 [显微镜];

学科分类号：

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页码：99 / 101

页数：3

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