K-EDGE EXAFS OF GE IN GEX SE1-X

被引:0
|
作者
SEN, SC
机构
来源
PHYSICA B | 1989年 / 158卷 / 1-3期
关键词
D O I
10.1016/0921-4526(89)90411-0
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:619 / 620
页数:2
相关论文
共 50 条
  • [1] SIMS ANALYSIS OF GEX SE1-X AMORPHOUS THIN-FILMS
    AISSAOUI, R
    LHERMITTE, C
    VAUTIER, C
    TADJEDDINE, A
    [J]. MATERIALS CHEMISTRY AND PHYSICS, 1986, 14 (03) : 229 - 237
  • [2] SOFT-X-RAY ABSORPTION AND EXAFS ON THE K-EDGE OF ALUMINUM
    FONTAINE, A
    LAGARDE, P
    RAOUX, D
    ESTEVA, JM
    [J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1979, 9 (10): : 2143 - 2153
  • [3] K-EDGE EXAFS SPECTRA OF COPPER POLYPHTHALOCYANINES
    AKOPDZHANOV, RG
    [J]. VYSOKOMOLEKULYARNYE SOEDINENIYA SERIYA A & SERIYA B, 1994, 36 (03): : 507 - 509
  • [4] MN AND TE K-EDGE EXAFS STUDIES OF ZN1-XMNXTE
    HAPPO, N
    SATO, H
    MIHARA, T
    MIMURA, K
    HOSOKAWA, S
    UEDA, Y
    TANIGUCHI, M
    [J]. PHYSICA B, 1995, 208 (1-4): : 291 - 292
  • [5] SI K-EDGE AND GE K-EDGE X-RAY-ABSORPTION SPECTROSCOPY OF THE SI-GE INTERFACE IN [(SI)M(GE)N]P ATOMIC LAYER SUPERLATTICES
    HITCHCOCK, AP
    TYLISZCZAK, T
    AEBI, P
    XIONG, JZ
    SHAM, TK
    BAINES, KM
    MUELLER, KA
    FENG, XH
    CHEN, JM
    YANG, BX
    LU, ZH
    BARIBEAU, JM
    JACKMAN, TE
    [J]. SURFACE SCIENCE, 1993, 291 (03) : 349 - 369
  • [6] Gallium K-edge EXAFS measurements on cubic and hexagonal GaN
    Katsikini, M
    Rossner, H
    Fieber-Erdmann, M
    Holub-Krappe, E
    Moustakas, TD
    Paloura, EC
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 1999, 6 : 561 - 563
  • [7] THERMOMODULATED EXAFS SPECTRA ABOVE THE K-EDGE IN CU AND FE
    OLSON, CG
    LYNCH, DW
    WIELICZKA, DM
    KHUMALO, FS
    BARTLETT, RJ
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (19): : 3813 - 3823
  • [8] Gallium K-edge EXAFS study of GaN:Mg films
    Pan, YC
    Wang, SF
    Lee, WH
    Lin, WC
    Shu, CK
    Chiang, CI
    Lin, CH
    Chang, H
    Lee, JF
    Jang, LY
    Lin, DS
    Lee, MC
    Chen, WH
    Chen, WK
    [J]. OPTOELECTRONIC MATERIALS AND DEVICES II, 2000, 4078 : 535 - 543
  • [9] Exact atomic absorption background for Rb K-edge EXAFS
    Kodre, A
    Arcon, I
    Frahm, R
    [J]. JOURNAL DE PHYSIQUE IV, 1997, 7 (C2): : 195 - 197
  • [10] CE K-EDGE EXAFS SPECTRUM OF CEO2
    ASAKURA, K
    SATOW, Y
    KURODA, H
    [J]. JOURNAL DE PHYSIQUE, 1986, 47 (C-8): : 185 - 188