ELECTRON BACKSCATTERING ON EXTREMELY THIN SILICON MONO-CRYSTALS

被引：0
|
作者：
MULLER, HW [1 ]
SCHRODER, B [1 ]
机构：
[1] UNIV KAISERSLAUTERN,FACHBEREICH PHYS,D-6750 KAISERSLAUTERN,FED REP GER
来源：
MIKROSKOPIE | 1978年 / 34卷 / 5-6期
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：168 / 168
页数：1
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