COMPUTER-CONTROLLED MEASUREMENTS IN THIN-LAYER CHROMATOGRAPHY

被引：0
|
作者：
ALERT, D
EBEL, S
GEITZ, E
HOCKE, J
机构：
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1982年 / 311卷 / 04期
关键词：
D O I：
10.1007/BF00481806
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：442 / 442
页数：1
相关论文
共 50 条
  • [1] AUTOMATED COMPUTER-CONTROLLED EVALUATION IN THIN-LAYER CHROMATOGRAPHY
    EBEL, S
    GEITZ, E
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1979, 296 (05): : 369 - 373
  • [2] COMPUTER-CONTROLLED AUTOMATIC EVALUATION IN THIN-LAYER CHROMATOGRAPHY
    EBEL, S
    HOCKE, J
    CHROMATOGRAPHIA, 1977, 10 (03) : 123 - 128
  • [3] COMPUTER-CONTROLLED EVALUATION IN THIN-LAYER CHROMATOGRAPHY - RESULTS AND POSSIBILITIES
    EBEL, S
    HOCKE, J
    JOURNAL OF CHROMATOGRAPHY, 1976, 126 (NOV3): : 449 - 456
  • [4] COMPUTER-CONTROLLED SCRAPER FOR STANDARD THIN-LAYER PLATES
    FOSSLIEN, E
    MUSIL, F
    DOMIZI, D
    BLICKENSTAFF, L
    LUMENG, J
    JOURNAL OF CHROMATOGRAPHY, 1971, 63 (01): : 131 - +
  • [5] COMPUTER-CONTROLLED SCRAPER FOR STANDARD THIN-LAYER PLATES
    FOSSLIEN, E
    MUSIL, F
    JOURNAL OF CHROMATOGRAPHY, 1973, 78 (01): : 159 - 160
  • [6] CONTROLLED MIGRATION IN THIN-LAYER CHROMATOGRAPHY
    NUROK, D
    ANALYTICAL CHEMISTRY, 1981, 53 (04) : 714 - 716
  • [7] Temperature controlled thin-layer chromatography
    Zarzycki, PK
    Lamparczyk, H
    CHEMIA ANALITYCZNA, 2001, 46 (04): : 469 - 475
  • [8] COMPUTER-CONTROLLED CHROMATOGRAPHY
    不详
    ELECTRONICS AND POWER, 1971, 17 (NNOV): : 438 - &
  • [9] THIN-LAYER CHROMATOGRAPHY UNDER CONTROLLED CONDITIONS
    BADINGS, HT
    JOURNAL OF CHROMATOGRAPHY, 1964, 14 (02): : 265 - &
  • [10] THIN-LAYER CHROMATOGRAPHY OF COMPUTER PRINTER RIBBON INKS
    KAUR, N
    JASUJA, OP
    SINGLA, AK
    FORENSIC SCIENCE INTERNATIONAL, 1992, 53 (01) : 51 - 60
12345