ADSORPTION PROPERTIES OF POROUS SILICON CHARACTERIZED BY OPTICALLY ENHANCED XE-129 NMR-SPECTROSCOPY

被引：36
|
作者：
PIETRASS, T [1 ]
BIFONE, A [1 ]
PINES, A [1 ]
机构：
[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,BERKELEY,CA 94720
来源：
SURFACE SCIENCE | 1995年 / 334卷 / 1-3期
关键词：
NUCLEAR MAGNETIC RESONANCE; PHYSICAL ADSORPTION; SURFACE STRUCTURE;
D O I：
10.1016/0039-6028(95)80024-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Highly spin polarized xenon is used to study the adsorption properties of porous silicon surfaces by Xe-129 NMR spectroscopy. The sensitivity enhancement through optical pumping allows the NMR characterization of small amounts of physisorbed xenon in a pressure regime typical for adsorption isotherms. Fully hydrogen terminated porous silicon, porous silicon with an increased number of dangling bonds and porous silicon after methanol adsorption are characterized by the adsorbed Xe-129 NMR lineshape, chemical shift and relaxation behavior.
引用
收藏
页码：L730 / L734
页数：5
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