X-RAY TOPOGRAPHIC STUDY OF LATTICE-DEFECTS RELATED WITH DEGRADATION OF GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE LASERS

被引：0
|
作者：
KISHINO, S [1 ]
NAKASHIMA, H [1 ]
ITO, R [1 ]
NAKADA, O [1 ]
MAKI, M [1 ]
机构：
[1] HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1976年 / 15卷
关键词：
D O I：
10.7567/JJAPS.15S1.303
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：303 / 307
页数：5
相关论文
共 50 条
  • [1] X-RAY TOPOGRAPHIC STUDY OF DARK-SPOT DEFECTS IN GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE WAFERS
    KISHINO, S
    NAKASHIMA, H
    ITO, R
    NAKADA, O
    [J]. APPLIED PHYSICS LETTERS, 1975, 27 (04) : 207 - 209
  • [2] X-RAY TOPOGRAPHIC OBSERVATION OF DARK-LINE DEFECTS IN GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE WAFERS
    KISHINO, S
    NAKASHIMA, H
    CHINONE, N
    ITO, R
    [J]. APPLIED PHYSICS LETTERS, 1976, 28 (02) : 98 - 100
  • [3] EFFECTS OF COMPOSITION PROFILE ON CHARACTERISTICS OF GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE LASERS
    NAKASHIMA, H
    CHINONE, N
    TAGUCHI, Y
    NAKADA, O
    [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) : 2688 - 2689
  • [4] GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE DISTRIBUTED-FEEDBACK DIODE LASERS
    NAKAMURA, M
    AIKI, K
    UMEDA, J
    YARIV, A
    YEN, HW
    MORIKAWA, T
    [J]. APPLIED PHYSICS LETTERS, 1974, 25 (09) : 487 - 488
  • [5] GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE INJECTION-LASERS WITH DISTRIBUTED BRAGG REFLECTORS
    TSANG, WT
    WANG, S
    [J]. OPTICS COMMUNICATIONS, 1976, 18 (01) : 38 - 39
  • [6] GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE INJECTION-LASERS WITH DISTRIBUTED BRAGG REFLECTORS
    TSANG, WT
    WANG, S
    [J]. APPLIED PHYSICS LETTERS, 1976, 28 (10) : 596 - 598
  • [7] MEASUREMENT OF MINORITY-CARRIER LIFETIME DURING GRADUAL DEGRADATION OF GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE LASERS
    CHINONE, N
    ITO, R
    NAKADA, O
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1974, QE10 (01) : 81 - 84
  • [8] LIMITATIONS OF POWER OUTPUTS FROM CONTINUOUSLY OPERATING GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE LASERS
    CHINONE, N
    ITO, R
    NAKADA, O
    [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (02) : 785 - 786
  • [9] DARK-LINE DEFECTS INDUCED BY MECHANICAL BENDING IN GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE WAFERS
    KISHINO, S
    CHINONE, N
    NAKASHIMA, H
    ITO, R
    [J]. APPLIED PHYSICS LETTERS, 1976, 29 (08) : 488 - 490
  • [10] GAAS-GA1-XALXAS BURIED-HETEROSTRUCTURE INJECTION LASERS
    TSUKADA, T
    [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) : 4899 - 4906
12345