LATTICE IMAGING AND GRAIN-BOUNDARIES STUDIES IN GERMANIUM AND SILICON

被引：0
|
作者：
BOURRET, A [1 ]
DANTARROCHES, C [1 ]
DESSEAUX, J [1 ]
机构：
[1] CEN,DEPT RECH FONDAMENTALE,PHYS SOLIDES SECT,F-38041 GRENOBLE,FRANCE
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1980年 / 127卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
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页码：C387 / C387
页数：1
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