A KOLMOGOROV SMIRNOV GOODNESS-OF-FIT TEST FOR THE 2-PARAMETER WEIBULL DISTRIBUTION WHEN THE PARAMETERS ARE ESTIMATED FROM THE DATA

被引：21

作者：

PARSONS, FG ^{[1
]}

WIRSCHING, PH ^{[1
]}

机构：

[1] UNIV ARIZONA,TUCSON,AZ 85721

来源：

MICROELECTRONICS AND RELIABILITY | 1982年 / 22卷 / 02期

关键词：

D O I：

10.1016/0026-2714(82)90174-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：163 / 167

页数：5

共 50 条

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