COINCIDENCE DETECTION AND SELECTION IN POSITRON EMISSION TOMOGRAPHY USING VLSI

被引：13
|
作者：
NEWPORT, DF
DENT, HM
CASEY, ME
BOULDIN, DW
机构：
[1] UNIV TENNESSEE,KNOXVILLE,TN 37996
[2] COMP TECHNOL & IMAGING INC,KNOXVILLE,TN
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 01期
关键词：
D O I：
10.1109/23.34604
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1052 / 1055
页数：4
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