APPLICATION OF MULTIPLE BEAM INTERFERENCE TO THE MEASUREMENT OF LONG END STANDARDS

被引：0

|

作者：

SAUNDERS, JB

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1960年 / 50卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：183 / 183

页数：1

相关论文

共 50 条

[1] MEASUREMENT OF THE THICKNESS OF THIN FILMS BY MULTIPLE-BEAM INTERFERENCE
WEAVER, C
BENJAMIN, P
NATURE, 1956, 177 (4518) : 1030 - 1031
[2] MULTIPLE BEAM INTERFERENCE IN ANISOTROPIC CRYSTALS AND THE CONSEQUENCES FOR THE BIREFRINGENCE MEASUREMENT
BOSCH, G
JAHN, IR
PRANDL, W
VERHEIN, M
PHYSICA B & C, 1986, 142 (03): : 320 - 327
[3] Long trace profiler based on multiple-beam interference
Li, Jing
Gong, Yan
Liao, Jiasheng
Zhang, Wei
Guangxue Xuebao/Acta Optica Sinica, 2014, 34 (03):
[4] LONG-PATH MULTIPLE-WAVELENGTH MULTIPLE-BEAM INTERFERENCE FRINGES
HERRIOTT, DR
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (06) : 719 - &
[5] INTERFERENCE METHODS FOR PRODUCING AND CALIBRATING END STANDARDS
PETERS, CG
EMERSON, WB
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1950, 44 (04): : 419 - 442
[6] Complementarity in multiple beam interference
Luis, A
JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 2001, 34 (41): : 8597 - 8600
[7] Research on multiple-beam interference of pointolite and measurement of minute wedge angle
Qi, Shengwen
Yang, Xiuqin
Lu, Hongguang
OPTIK, 2013, 124 (18): : 3586 - 3589
[8] MEASUREMENT OF REFRACTIVE INDEX AND DISPERSION OF MICA EMPLOYING MULTIPLE BEAM INTERFERENCE TECHNIQUES
BAILEY, AI
KAY, SM
BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (01): : 39 - &
[9] USE OF MULTIPLE-REGRESSION IN DEVELOPING WORK MEASUREMENT STANDARDS - PROPOSED APPLICATION
MILLER, OW
SIAM REVIEW, 1976, 18 (04) : 818 - 818
[10] MULTIPLE-BEAM INTERFERENCE MICROSCOPY
FAUST, RC
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1952, 211 (1105): : 240 - 254

← 1 2 3 4 5 →