MEASUREMENT OF DIFFUSION-COEFFICIENT USING A CLOSED CAPILLARY TECHNIQUE

被引：2

作者：

WRIGHT, JE

STEVENS, GW

KELLY, ED

WHITE, LR

机构：

[1] UNIV MELBOURNE,DEPT CHEM ENGN,PARKVILLE,VIC 3052,AUSTRALIA

[2] UNIV MELBOURNE,SCH MATH,PARKVILLE,VIC 3052,AUSTRALIA

来源：

AICHE JOURNAL | 1994年 / 40卷 / 02期

关键词：

D O I：

10.1002/aic.690400215

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

[No abstract available]

引用

页码：365 / 368

页数：4

共 50 条

[1] DIFFUSION OF A SURFACTANT IN A CAPILLARY MEASUREMENT OF DIFFUSION-COEFFICIENT AT LOW CONCENTRATIONS
FAINERMAN, VB
ZHIDKOV, VV
[J]. COLLOID JOURNAL OF THE USSR, 1976, 38 (01): : 90 - 94
[2] MEASUREMENT OF DIFFUSION-COEFFICIENT OF BORON IN SOIL USING A SINGLE CELL TECHNIQUE
SULAIMAN, W
KAY, BD
[J]. SOIL SCIENCE SOCIETY OF AMERICA PROCEEDINGS, 1972, 36 (05): : 746 - +
[3] TIME-LAG TECHNIQUE OF DIFFUSION-COEFFICIENT MEASUREMENT IN SOLUTION SPINNING
WU, W
PAUL, DR
[J]. TEXTILE RESEARCH JOURNAL, 1978, 48 (04) : 230 - 233
[4] MEASUREMENT OF THE DIFFUSION-COEFFICIENT OF ALUMINUM IN MERCURY
ZIEGEL, S
PELED, E
GILEADI, E
[J]. ELECTROCHIMICA ACTA, 1979, 24 (05) : 513 - 516
[5] MEASUREMENT OF THE DIFFUSION-COEFFICIENT OF COBALT IN COPPER
DOHL, R
MACHT, MP
NAUNDORF, V
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 86 (02): : 603 - 612
[6] MEASUREMENT OF THE DIFFUSION-COEFFICIENT OF NAPHTHALENE INTO AIR
CHO, KN
IRVINE, TF
KARNI, J
[J]. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 1992, 35 (04) : 957 - 966
[7] MEASUREMENT OF THE DIFFUSION-COEFFICIENT OF LI IN ARGON
JUDISH, JP
WUNDERLICH, RK
[J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1987, 20 (10) : 2317 - 2325
[8] DIFFUSION-COEFFICIENT DETERMINATION USING A SIZE-VARIATION TECHNIQUE
STARK, WA
[J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (08) : 4583 - 4585
[9] MEASUREMENT OF CHEMICAL DIFFUSION-COEFFICIENT IN OXIDES USING RELAXATION METHOD
MORIN, F
[J]. CANADIAN METALLURGICAL QUARTERLY, 1975, 14 (02) : 97 - 104
[10] A NOVEL TECHNIQUE FOR THE SIMULTANEOUS MEASUREMENT OF AMBIPOLAR CARRIER LIFETIME AND DIFFUSION-COEFFICIENT IN SILICON
ROSLING, M
BLEICHNER, H
LUNDQVIST, M
NORDLANDER, E
[J]. SOLID-STATE ELECTRONICS, 1992, 35 (09) : 1223 - 1227

← 1 2 3 4 5 →