ON THE DEVELOPMENT OF A 3D TOMOGRAPHIC ATOM-PROBE

被引：15
|
作者：
DECONIHOUT, B
BOSTEL, A
MENAND, A
SARRAU, JM
BOUET, M
CHAMBRELAND, S
BLAVETTE, D
机构：
[1] Laboratoire de Microscopie Ionique, URA CNRS 808, Faculté des Sciences et Techniques, Cedex, BP 118
来源：
APPLIED SURFACE SCIENCE | 1993年 / 67卷 / 1-4期
关键词：
D O I：
10.1016/0169-4332(93)90351-B
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The development of a three-dimensional atom-probe relies on the design of a position sensitive detector. The multidetection system that we have developed is based on the use of a 10 x 10 anodes array placed behind two microchannel-plates assembly in a chevron arrangement. The spread of charge between MCP and the multianode is used to derive the position of ions striking the detector. Spatial coordinates can be calculated for multiple and simultaneous time-of-flight events. The procedure that we have used for the derivation of ions positions from charge measurement is given and preliminary results are described.
引用
收藏
页码：444 / 450
页数：7
相关论文
共 50 条
  • [1] TOWARD A TOMOGRAPHIC ATOM-PROBE
    BOSTEL, A
    BLAVETTE, D
    MENAND, A
    SARRAU, JM
    [J]. JOURNAL DE PHYSIQUE, 1989, 50 (C8): : C8501 - C8506
  • [2] Ion irradiation induced solute clustering in steel:: A 3D nanoanalysis with the tomographic atom-probe
    Pareige, P
    Pérocheau, F
    Auger, P
    Jumel, S
    Bernas, H
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 178 : 233 - 236
  • [3] A GENERAL PROTOCOL FOR THE RECONSTRUCTION OF 3D ATOM-PROBE DATA
    BAS, P
    BOSTEL, A
    DECONIHOUT, B
    BLAVETTE, D
    [J]. APPLIED SURFACE SCIENCE, 1995, 87-8 (1-4) : 298 - 304
  • [4] Trajectories of field emitted ions in 3D atom-probe
    Vurpillot, F
    Bostel, A
    Menand, A
    Blavette, D
    [J]. EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 1999, 6 (02): : 217 - 221
  • [5] A model accounting for spatial overlaps in 3D atom-probe microscopy
    Blavette, D
    Vurpillot, F
    Pareige, P
    Menand, A
    [J]. ULTRAMICROSCOPY, 2001, 89 (1-3) : 145 - 153
  • [6] DEVELOPMENT OF A SCANNING ATOM-PROBE
    NISHIKAWA, O
    KIMOTO, M
    IWATSUKI, M
    ISHIKAWA, Y
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (02): : 599 - 602
  • [7] Intragranular precipitation in Inconel 706:: 3D atom-probe and HRTEM investigations
    Kindrachuk, V
    Wanderka, N
    Banhart, J
    Mukherji, D
    Del Genovessè, D
    Rösler, J
    [J]. STEEL RESEARCH INTERNATIONAL, 2004, 75 (01): : 74 - 78
  • [8] Atom-Probe Tomographic Studies of Thin Films and Multilayers
    Larson, David J.
    Cerezo, Alfred
    Juraszek, Jean
    Hono, Kazuhiro
    Schmitz, Guido
    [J]. MRS BULLETIN, 2009, 34 (10) : 732 - 737
  • [9] THE TOMOGRAPHIC ATOM-PROBE - NEW DIMENSIONS IN MATERIALS ANALYSIS
    DECONIHOUT, B
    CHAMBERLAND, S
    BLAVETTE, D
    [J]. ADVANCED MATERIALS, 1994, 6 (09) : 695 - 698
  • [10] Atom-Probe Tomographic Studies of Thin Films and Multilayers
    David J. Larson
    Alfred Cerezo
    Jean Juraszek
    Kazuhiro Hono
    Guido Schmitz
    [J]. MRS Bulletin, 2009, 34 : 732 - 737
12345