SINGLE-EVENT UPSET (SEU) IN A DRAM WITH ON-CHIP ERROR CORRECTION

被引：12
|
作者：
ZOUTENDYK, JA [1 ]
SCHWARTZ, HR [1 ]
WATSON, RK [1 ]
HASNAIN, Z [1 ]
NEVILL, LR [1 ]
机构：
[1] MICRON TECHNOL INC,BOISE,ID 83706
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期
关键词：
D O I：
10.1109/TNS.1987.4337471
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1310 / 1315
页数：6
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