LOCAL CRYSTAL-LATTICE CURVATURE MEASUREMENTS FOR BENT-CRYSTAL SPECTROMETERS

被引：2
|
作者：
SCHUMACHER, U
NOLTE, R
机构：
[1] Max-Planck-Institut für Plasmaphysik, EURATOM-IPP Association
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 01期
关键词：
D O I：
10.1063/1.1141886
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The geometrical orientation and curvature radius of the lattice of cylindrically bent crystals in high-resolution x-ray spectrometers for plasma diagnostics are determined locally on the crystal surface by means of a double-crystal device in conjunction with precise transverse displacements of the x-ray beam and accurate angular recordings of the crystal. Surface areas of the crystal which have imperfect orientation and curvature quality and hence contribute to resolving power degradation are thus clearly identified.
引用
收藏
页码：121 / 123
页数：3
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