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MEASUREMENT OF THE PHOTOELECTRIC YIELD FOR ULTRA-SOFT X-RAY RADIATION

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作者：
LUKIRSKY, AP
RUMSH, MA
SMIRNOV, LA
机构：
来源：
OPTIKA I SPEKTROSKOPIYA | 1960年 / 9卷 / 04期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
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页码：511 / 515
页数：5
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