X-RAY DETERMINATION OF RESIDUAL STRESS

被引：0
|
作者：
NORTON, JT [1 ]
机构：
[1] ADV MET RES CORP,BURLINGTON,MA 01803
来源：
MATERIALS EVALUATION | 1973年 / 31卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：A21 / A21
页数：1
相关论文
共 50 条
  • [1] Residual stress determination in microsystems using X-ray diffraction
    Kämpfe, B
    Kämpfe, A
    Auerswald, E
    Kassem, ME
    [J]. MICRO MATERIALS, PROCEEDINGS, 2000, : 695 - 699
  • [2] X-ray Diffraction for the Determination of Residual Stress of Crystalline Material: An Overview
    Lodh, Arijit
    Thool, Khushahal
    Samajdar, Indradev
    [J]. TRANSACTIONS OF THE INDIAN INSTITUTE OF METALS, 2022, 75 (04) : 983 - 995
  • [3] X-ray Diffraction for the Determination of Residual Stress of Crystalline Material: An Overview
    Arijit Lodh
    Khushahal Thool
    Indradev Samajdar
    [J]. Transactions of the Indian Institute of Metals, 2022, 75 : 983 - 995
  • [4] X-RAY RESIDUAL STRESS DETERMINATION IN THIN CHROMIUM COATINGS ON STEEL
    Eigenmann, B.
    Scholtes, B.
    Macherauch, E.
    [J]. SURFACE ENGINEERING, 1991, 7 (03) : 221 - 224
  • [5] X-RAY RESIDUAL-STRESS DETERMINATION ON LARGE SPECIMENS AND STRUCTURES
    EFANOV, VP
    SEMENOV, AY
    [J]. INDUSTRIAL LABORATORY, 1988, 54 (02): : 168 - 170
  • [6] Residual Stress Determination by X-Ray Diffraction with Stress of Two Directions Analysis Method
    Feng, Aixin
    Sun, Huaiyang
    Cao, Yupeng
    Xu, Chuanchao
    Nie, Guifeng
    Wang, Junwei
    Zhou, Pengcheng
    [J]. ADVANCES IN MECHATRONICS TECHNOLOGY, 2011, 43 : 569 - 572
  • [7] APPLICATION OF LONG FOCAL DISTANCES TO AN X-RAY METHOD FOR THE DETERMINATION OF RESIDUAL STRESS
    BRUSILOVSKII, BA
    [J]. INDUSTRIAL LABORATORY, 1958, 24 (01): : 46 - 51
  • [8] Weighted mechanical models for residual stress determination using x-ray diffraction
    Murray, Conal E.
    Bedell, Stephen W.
    Ryan, E. Todd
    [J]. JOURNAL OF APPLIED PHYSICS, 2013, 114 (03)
  • [9] X-ray diffraction in thermal treatments: Determination of residual austenite by X-ray diffraction
    Bach, M
    Broll, N
    Cornet, A
    Gaide, L
    [J]. JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 887 - 895
  • [10] Residual stress determination by the layer removal and X-ray diffraction measurement correction method
    Dlhy, Pavol
    Poduska, Jan
    Pokorny, Pavel
    Jambor, Michal
    Nahlik, Lubos
    Hutar, Pavel
    [J]. METHODSX, 2022, 9
12345