ATTACHMENT FOR EXAMINING CUTTING TRACKS IN A SCANNING ELECTRON-MICROSCOPE

被引:0
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作者
ASHKEROV, YV
BYKOV, MV
REPKIN, MV
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SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1988年 / 55卷 / 01期
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O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:52 / 54
页数:3
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