SAMPLING OF SUB-MICRON PARTICLES FOR ELECTRON MICROSCOPY

被引：6

|

作者：

BILLINGS, CE

WIFFEN, RD

MEGAW, WJ

机构：

来源：

NATURE | 1961年 / 189卷 / 476期

关键词：

D O I：

10.1038/189336a0

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

收藏

页码：336 / &

相关论文

共 50 条

[1] SCANNING ELECTRON-MICROSCOPY IN SUB-MICRON STRUCTURE DIAGNOSTICS
ARISTOV, VV
KAZMIRUK, VV
USHAKOV, NG
YAKIMOV, EB
ZAITSEV, SI
[J]. VACUUM, 1988, 38 (11) : 1045 - 1050
[2] On visualization of sub-micron particles with dark-field light microscopy
Abdel-Fattah, AI
El-Genk, MS
Reimus, PW
[J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2002, 246 (02) : 410 - 412
[3] Mechanical Testing of Micron and Sub-Micron Samples Using In-Situ Electron Microscopy
Kiener, Daniel
[J]. DETERMINATION OF MECHANICAL PROPERTIES OF MATERIALS BY SMALL PUNCH AND OTHER MINIATURE TESTING TECHNIQUES, 2ND INTERNATIONAL CONFERENCE SSTT, 2012, : 239 - 244
[4] Ultrasonic measurement of sub-micron particles
Scott, DM
Boxman, A
Jochen, CE
[J]. PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, 1995, 12 (06) : 269 - 273
[5] SILICON IN SUB-MICRON PARTICLES IN THE SOUTHWEST
PITCHFORD, M
FLOCCHINI, RG
DRAFTZ, RG
CAHILL, TA
ASHBAUGH, LL
ELDRED, RA
[J]. ATMOSPHERIC ENVIRONMENT, 1981, 15 (03) : 321 - 333
[6] Detecting sub-micron airborne particles
不详
[J]. TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 2000, 19 (11) : V - VI
[7] THE AVERAGE SIZE OF SUB-MICRON PARTICLES
RICH, TA
[J]. INTERNATIONAL JOURNAL OF AIR POLLUTION, 1959, 1 (04): : 288 - 292
[8] SINTERING OF SUB-MICRON METALLIC PARTICLES
BLACHERE, JR
SEDEHI, A
MEIKSIN, ZH
[J]. JOURNAL OF MATERIALS SCIENCE, 1984, 19 (04) : 1202 - 1206
[9] Sub-micron particles are rigid and elastic
不详
[J]. CHEMICAL ENGINEERING PROGRESS, 1999, 95 (04) : 16 - 17
[10] MAGNETIC SEPARATION OF SUB-MICRON PARTICLES
TAKAYASU, M
GERBER, R
FRIEDLAENDER, FJ
[J]. IEEE TRANSACTIONS ON MAGNETICS, 1983, 19 (05) : 2112 - 2114

← 1 2 3 4 5 →