NEAR-SURFACE DEFECT DETECTION

被引：0
|
作者：
MUCCIARDI, AN
SHANKAR, R
机构：
[1] TETRA TECH INC,ARLINGTON,VA 22210
[2] INDIANA INST TECHNOL,FT WAYNE,IN 46803
来源：
MATERIALS EVALUATION | 1981年 / 39卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：74 / 77
页数：4
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