SYNTHESIS OF DIFFRACTION LINE PROFILES FROM CONTINUOUS SCANNING DATA

被引：0
|
作者：
GANGULEE, A
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1970年 / 41卷 / 08期
关键词：
D O I：
10.1063/1.1684759
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1199 / &
相关论文
共 50 条
  • [1] Diffraction line profiles from polydisperse crystalline systems
    Scardi, P
    Leoni, M
    ACTA CRYSTALLOGRAPHICA SECTION A, 2001, 57 : 604 - 613
  • [2] On the modelling of diffraction line profiles from nanocrystalline materials
    Scardi, P.
    Leoni, M.
    Dodoo-Arhin, D.
    APPLIED CRYSTALLOGRAPHY XXI, 2010, 163 : 19 - 26
  • [3] Powder diffraction line profiles from the size and shape of nanocrystallites
    Beyerlein, K. R.
    Snyder, R. L.
    Scardi, P.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2011, 44 : 945 - 953
  • [4] Dislocation Effects on the Diffraction Line Profiles from Nanocrystalline Domains
    Alberto Leonardi
    Paolo Scardi
    Metallurgical and Materials Transactions A, 2016, 47 : 5722 - 5732
  • [5] Dislocation Effects on the Diffraction Line Profiles from Nanocrystalline Domains
    Leonardi, Alberto
    Scardi, Paolo
    METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2016, 47A (12): : 5722 - 5732
  • [6] Line profiles from discrete kinematic data
    Amorisco, N. C.
    Evans, N. W.
    MONTHLY NOTICES OF THE ROYAL ASTRONOMICAL SOCIETY, 2012, 424 (03) : 1899 - 1913
  • [7] Diffraction Line Profiles in the Rietveld Method
    Scardi, Paolo
    CRYSTAL GROWTH & DESIGN, 2020, 20 (10) : 6903 - 6916
  • [8] X-RAY-POWDER DIFFRACTION LINE-PROFILES BY FOURIER SYNTHESIS
    KOGAN, VA
    KUPRIYANOV, MF
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 (pt 1) : 16 - 25
  • [9] CONTINUOUS PLASMA DENSITY MEASUREMENTS FROM SPECTRAL LINE PROFILES
    STIRLING, AJ
    WESTWOOD, WD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (10): : 1575 - &
  • [10] Calculation of diffraction line profiles for structures with dislocations
    Kamminga, JD
    Delhez, R
    EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2001, 378-3 : 142 - 147
12345