WEAK-LOCALIZATION, UNIVERSAL CONDUCTANCE FLUCTUATIONS, AND 1/F NOISE IN AG

被引：23

作者：

MCCONVILLE, P ^{[1
]}

BIRGE, NO ^{[1
]}

机构：

[1] MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT RES,E LANSING,MI 48824

来源：

PHYSICAL REVIEW B | 1993年 / 47卷 / 24期

关键词：

D O I：

10.1103/PhysRevB.47.16667

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have measured the magnetoresistance and the magnetic-field dependence of the 1/f noise in thin Ag films over the temperature range 1-25 K. Fits of the data to the theories of weak localization and universal conductance fluctuations, respectively, yield two independent estimates of the phase-breaking length L(phi). These two estimates of L(phi) are in general agreement in overall magnitude and temperature dependence, but there is a noticeable discrepancy at 1.0 and 4.4 K. We believe that this discrepancy is significant, and may point to an inadequate treatment of electron-electron interactions in the present theories.

引用

页码：16667 / 16670

页数：4

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