KONDO TEMPERATURE OF INTERACTING MAGNETIC IMPURITIES

被引:16
|
作者
MATHO, K
BEALMONO.MT
机构
[1] INST MAX VON LAUE PAUL LANGEVIN,GRENOBLE 38,FRANCE
[2] FAC SCI ORSAY,CNRS.LABS PHYS SOLIDES,ORSAY 91,FRANCE
来源
JOURNAL OF PHYSICS F-METAL PHYSICS | 1973年 / 3卷 / 01期
关键词
D O I
10.1088/0305-4608/3/1/025
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:136 / 144
页数:9
相关论文
共 50 条
  • [1] MAGNETIC IMPURITIES AND SUPERCONDUCTIVITY BELOW KONDO TEMPERATURE
    CELLI, V
    ZUCKERMANN, MJ
    PHYSICS LETTERS A, 1967, A 25 (04) : 305 - +
  • [2] KONDO TEMPERATURE OF A STRONGLY COUPLED PAIR OF MAGNETIC IMPURITIES
    SATO, K
    NAGAOKA, Y
    PROGRESS OF THEORETICAL PHYSICS, 1972, 47 (01): : 348 - &
  • [3] MAGNETIC IMPURITIES AND SUPERCONDUCTIVITY BELOW KONDO TEMPERATURE . NAGAOKAS MODEL
    ZUCKERMANN, MJ
    PHYSICAL REVIEW, 1968, 168 (02): : 390 - +
  • [4] KONDO RESISTIVITY DUE TO A PAIR OF INTERACTING IMPURITIES
    BEALMONOD, MT
    PHYSICAL REVIEW, 1969, 178 (02): : 874 - +
  • [5] MAGNETIC IMPURITIES AND SUPERCONDUCTIVITY BELOW KONDO TEMPERATURE IN MODEL OF TAKANO AND OGAWA
    CELLI, V
    ZUCKERMANN, MJ
    NUOVO CIMENTO B, 1968, 58 (01): : 154 - +
  • [6] Kondo temperature of magnetic impurities at surfaces -: art. no. 176603
    Wahl, P
    Diekhöner, L
    Schneider, MA
    Vitali, L
    Wittich, G
    Kern, K
    PHYSICAL REVIEW LETTERS, 2004, 93 (17) : 176603 - 1
  • [7] MAGNETIC-IMPURITIES AND KONDO EFFECT
    NOZIERES, P
    ANNALES DE PHYSIQUE, 1985, 10 (01) : 19 - 35
  • [8] Kondo effect in the presence of magnetic impurities
    Heersche, HB
    de Groot, Z
    Folk, JA
    Kouwenhoven, LP
    van der Zant, HSJ
    Houck, AA
    Labaziewicz, J
    Chuang, IL
    PHYSICAL REVIEW LETTERS, 2006, 96 (01)
  • [9] Kondo Effect of Magnetic Impurities in Nanotubes
    Baruselli, P. P.
    Smogunov, A.
    Fabrizio, M.
    Tosatti, E.
    PHYSICAL REVIEW LETTERS, 2012, 108 (20)
  • [10] Kondo effect of magnetic impurities on nanotubes
    Baruselli, P. P.
    Smogunov, A.
    Fabrizio, M.
    Tosatti, E.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2012, 44 (06): : 1040 - 1044