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- [2] PRECISION MEASUREMENT OF LATTICE IMPERFECTIONS WITH A PHOTOGRAPHIC 2-CRYSTAL METHOD REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (03): : 334 - &
- [4] CHANGE OF LATTICE-CONSTANT ON X-RAY IRRADIATION OF AN IMPURE SINGLE-CRYSTAL OF LITHIUM-FLUORIDE SOVIET PHYSICS SOLID STATE,USSR, 1972, 13 (11): : 2887 - &
- [5] The K-alpha-duplicate, based on a new representation of lattice constant of a crystal PHYSIKALISCHE ZEITSCHRIFT, 1922, 23 : 114 - 120
- [6] ASYMMETRIC REFLECTIONS USED FOR 2-CRYSTAL X-RAY TOPOGRAPHY FOR DEFORMED SINGLE-CRYSTAL SILICON PLATES INDUSTRIAL LABORATORY, 1989, 55 (12): : 1402 - 1405
- [8] Effects of chemical binding on the x-ray K alpha(1) (2) doublet lines of sulphur studied with a two-crystal spectrometer PHYSICAL REVIEW, 1936, 49 (01): : 14 - 16
- [9] INFLUENCE OF METHOD FOR SEPARATION OF K-ALPHAL-K-ALPHA2 DOUBLET AND HEIGHT OF CONTINUOUS DEPTH ON DIFFRACTION PROFILES OF X-RAYS COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1972, 275 (01): : 33 - &