TESTABLE CIRCUIT-DESIGN FOR RING TESTING

被引：0

作者：

LATYPOV, RK

机构：

来源：

AUTOMATION AND REMOTE CONTROL | 1992年 / 53卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

A combinational circuit structure is proposed, which allows detection of simple stuck-at faults in ring testing. The combinational circuit has a two-level realization using AND and EXCLUSIVE OR elements with supplementary EXCLUSIVE OR control elements and conjunctions. The ring testing system combines the functions of a test pattern generator and a signature analyzer and reproduces a standard test using the (n + 1) patterns 11...11, 11...10, ..., 01...11.

引用

页码：262 / 264

页数：3

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