TESTABLE CIRCUIT-DESIGN FOR RING TESTING

被引：0
|
作者：
LATYPOV, RK
机构：
来源：
AUTOMATION AND REMOTE CONTROL | 1992年 / 53卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A combinational circuit structure is proposed, which allows detection of simple stuck-at faults in ring testing. The combinational circuit has a two-level realization using AND and EXCLUSIVE OR elements with supplementary EXCLUSIVE OR control elements and conjunctions. The ring testing system combines the functions of a test pattern generator and a signature analyzer and reproduces a standard test using the (n + 1) patterns 11...11, 11...10, ..., 01...11.
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页码：262 / 264
页数：3
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