HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF INP

被引：9

作者：

WILLIAMS, JO ^{[1
]}

CRAWFORD, ES ^{[1
]}

BROWN, GT ^{[1
]}

COCKAYNE, B ^{[1
]}

机构：

[1] ROYAL SIGNALS & RADAR ESTAB,MALVERN WR14 3PS,WORCS,ENGLAND

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1982年 / 1卷 / 11期

关键词：

D O I：

10.1007/BF00721940

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：499 / 502

页数：4

共 50 条

[1] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
BARRY, JC
ANSTIS, GR
[J]. MATERIALS FORUM, 1994, 18 : 31 - 50
[2] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
GIBSON, JM
[J]. MRS BULLETIN, 1991, 16 (03) : 27 - 33
[3] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
GRUEHN, R
ROSS, R
[J]. CHEMIE IN UNSERER ZEIT, 1987, 21 (06) : 194 - 206
[4] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS OF INGAAS/INP MULTILAYER HETEROSTRUCTURES
YABUUCHI, Y
TAKAHASHI, Y
OHTSUKA, N
ISSHIKI, T
TSUJIKURA, M
SAIJO, H
SHIOJIRI, M
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 127 (02): : 385 - 396
[5] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF HETEROSTRUCTURES
CERVA, H
[J]. SOLID-STATE ELECTRONICS, 1994, 37 (4-6) : 1045 - 1052
[6] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY (HRTEM)
GRUEHN, R
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (07): : 781 - 781
[7] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY IN MINERALOGY
BUSECK, PR
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 196 : 119 - GEOC
[8] INP-INSULATOR INTERFACE STRUCTURE STUDIED BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
NOZAKI, C
YASUAMI, S
ISHIMURA, H
TOKUDA, H
[J]. JOURNAL OF CRYSTAL GROWTH, 1990, 99 (1-4) : 371 - 374
[9] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF INASXP1-X/INP HETEROSTRUCTURES
LI, DX
SCHNEIDER, RP
WESSELS, BW
CHIOU, WA
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C378 - C378
[10] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
LIU, J
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1993, 52 (3-4) : 335 - 346

← 1 2 3 4 5 →