INVESTIGATION OF RADIATION-DAMAGE THRESHOLD OF XENON LASER CAVITY MIRRORS

被引：0
|
作者：
DANILYCHEV, VA [1 ]
DOLGIKH, VA [1 ]
KERIMOV, OM [1 ]
SAGITOV, SI [1 ]
STAVROVSKII, DB [1 ]
机构：
[1] PN LEBEDEV PHYS INST,MOSCOW,USSR
来源：
KVANTOVAYA ELEKTRONIKA | 1974年 / 1卷 / 12期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：2650 / 2651
页数：2
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