CONTACTLESS METHOD FOR THE ESTIMATION OF RESISTIVITY AND LIFETIME OF SEMICONDUCTORS

被引：11

|

作者：

HENISCH, HK

ZUCKER, J

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1956年 / 27卷 / 06期

关键词：

D O I：

10.1063/1.1715590

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：409 / 410

页数：2

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