NANOMETER-SCALE COMPOSITIONAL IMAGING OF ORGANIC MONOLAYER FILMS USING FRICTIONAL FORCE MICROSCOPY

被引：0
|
作者：
GREEN, JBD
MCDERMOTT, MT
PORTER, MD
SIPERKO, LM
机构：
[1] US DOE,AMES LAB,CTR MICROANALYT INSTRUMENTAT,ENDICOTT,NY 13760
[2] IBM CORP,DIV MICROELECTR,ANALYT SOLUT LAB,ENDICOTT,NY 13760
[3] IOWA STATE UNIV SCI & TECHNOL,DEPT CHEM,AMES,IA 50011
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1995年 / 210卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：45 / COLL
相关论文
共 50 条
  • [1] NANOMETER-SCALE MAPPING OF CHEMICALLY DISTINCT DOMAINS AT WELL-DEFINED ORGANIC INTERFACES USING FRICTIONAL FORCE MICROSCOPY
    GREEN, JBD
    MCDERMOTT, MT
    PORTER, MD
    SIPERKO, LM
    [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1995, 99 (27): : 10960 - 10965
  • [2] Nanometer-scale elasticity measurements on organic monolayers using scanning force microscopy
    Kiridena, W
    Jain, V
    Kuo, PK
    Liu, GY
    [J]. SURFACE AND INTERFACE ANALYSIS, 1997, 25 (06) : 383 - 389
  • [3] NANOMETER-SCALE MORPHOLOGY OF HOMOEPITAXIAL DIAMOND FILMS BY ATOMIC FORCE MICROSCOPY
    SUTCU, LF
    THOMPSON, MS
    CHU, CJ
    HAUGE, RH
    MARGRAVE, JL
    DEVELYN, MP
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (14) : 1685 - 1687
  • [4] ORGANIC FILM FORMATION INVESTIGATED BY ATOMIC-FORCE MICROSCOPY ON THE NANOMETER-SCALE
    GESANG, T
    HOPER, R
    DIECKHOFF, S
    SCHLETT, V
    POSSART, W
    HENNEMANN, OD
    [J]. THIN SOLID FILMS, 1995, 264 (02) : 194 - 204
  • [5] Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization
    Zhang, Lan
    Ju, Yang
    Hosoi, Atsushi
    Fujimoto, Akifumi
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (12):
  • [6] Photocatalytic Decomposition of Organic Thin Films in a Nanometer-Scale by an Atomic Force Microscope
    Kobayashi, Kenkichiro
    Tomita, Yasumasa
    Maeda, Yasuhisa
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, 9 (06) : 3382 - 3386
  • [7] Identification of nanometer-scale compositional fluctuations in silicate glass using electron microscopy and spectroscopy
    Nakazawa, Katsuaki
    Miyata, Tomohiro
    Amma, Shin-ichi
    Mizoguchi, Teruyasu
    [J]. SCRIPTA MATERIALIA, 2018, 154 : 197 - 201
  • [8] Electrostatic force microscopy of silver nanocrystals with nanometer-scale resolution
    Nyffenegger, RM
    Penner, RM
    Schierle, R
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (13) : 1878 - 1880
  • [9] Nanometer-scale dimensional metrology with noncontact atomic force microscopy
    Marchman, H
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY X, 1996, 2725 : 527 - 539
  • [10] Nanometer-Scale Patterning on PMMA Resist by Force Microscopy Lithography
    Hassani, Sadegh Sedigheh
    Sobat, Zahra
    Aghabozorg, Hamid Reza
    [J]. IRANIAN JOURNAL OF CHEMISTRY & CHEMICAL ENGINEERING-INTERNATIONAL ENGLISH EDITION, 2008, 27 (04): : 29 - 34
12345