THERMAL EMISSION DECAY FOURIER-TRANSFORM INFRARED-SPECTROSCOPY

被引：34
|
作者：
IMHOF, RE
MCKENDRICK, AD
XIAO, P
机构：
[1] Photophysics Research, School of EEIE, South Bank University, London SE1 0AA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 11期
关键词：
D O I：
10.1063/1.1146151
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We present a new technique, thermal emission decay Fourier transform infrared spectroscopy, designed to perform noninvasive, noncontacting absorption spectrum measurements on unprepared, arbitrary surfaces. It uses pulsed optical heating of the near-surface region of the sample to produce transient thermal emission spectra in the midinfrared spectral region for room temperature samples. The raw data of intensity versus path difference versus time after excitation can be processed in two ways; (1) to yield time-resolved spectra for depth profiling of layered samples; and (2) to yield decay-associated spectra for absolute absorbance measurements of homogeneous samples. (C) 1995 American Institute of Physics.
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页码：5203 / 5213
页数：11
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