OPTICAL-CONSTANTS OF THE AL+ IMPLANTED LAYERS IN GAAS DETERMINED BY ELLIPSOMETRY AND REFLECTANCE MEASUREMENTS

被引：0
|
作者：
KULIK, M [1 ]
JEZIERSKI, K [1 ]
机构：
[1] WROCLAW TECH UNIV,INST PHYS,PL-50370 WROCLAW,POLAND
来源：
ACTA PHYSICA POLONICA A | 1989年 / 75卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：211 / 214
页数：4
相关论文
共 50 条
  • [1] OPTICAL-CONSTANTS DETERMINATION OF ION-IMPLANTED GAAS-LAYERS BY ELLIPSOMETRY
    KULIK, M
    ZUK, J
    [J]. ACTA PHYSICA POLONICA A, 1986, 69 (06) : 1141 - 1144
  • [2] THIN-FILM OPTICAL-CONSTANTS DETERMINED FROM INFRARED REFLECTANCE AND TRANSMITTANCE MEASUREMENTS
    BUFFETEAU, T
    DESBAT, B
    [J]. APPLIED SPECTROSCOPY, 1989, 43 (06) : 1027 - 1032
  • [3] DETERMINATION OF OPTICAL-CONSTANTS OF GADOLINIUM FROM REFLECTANCE MEASUREMENTS
    MOKHTAR, NA
    PETRAKIAN, JP
    FRAISSE, R
    [J]. COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1977, 285 (06): : 157 - 160
  • [4] OPTICAL-CONSTANTS OF YBACUO FROM POLARIZED REFLECTANCE MEASUREMENTS
    MARKOWITSCH, W
    MAYR, W
    SCHWAB, P
    WANG, XZ
    [J]. PHYSICA C, 1994, 223 (1-2): : 117 - 122
  • [5] MEASUREMENT OF GAAS TEMPERATURE-DEPENDENT OPTICAL-CONSTANTS BY SPECTROSCOPIC ELLIPSOMETRY
    KUO, CH
    ANAND, S
    DROOPAD, R
    CHOI, KY
    MARACAS, GN
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (02): : 1214 - 1216
  • [6] THEORETICAL APPROACH USING ELLIPSOMETRY FOR OPTICAL-CONSTANTS OF PHYSISORBED MONOATOMIC LAYERS
    QUENTEL, G
    KERN, R
    [J]. SURFACE SCIENCE, 1976, 55 (02) : 545 - 572
  • [7] ELLIPSOMETRY OF OPTICAL-CONSTANTS FOR ABSORBING FILMS
    SU, QH
    TANG, JF
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (12) : 1731 - 1731
  • [8] OPTICAL-CONSTANTS OF TUNGSTEN BRONZES BY ELLIPSOMETRY
    OWEN, J
    BENNER, R
    BRODY, E
    TEEGARDEN, K
    SHANKS, H
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 260 - 260
  • [9] EFFECT OF SURFACE-ROUGHNESS ON THE VALUES OF METAL OPTICAL-CONSTANTS DETERMINED BY THE ELLIPSOMETRY METHOD
    ZORIN, ZM
    CHURAEVA, MN
    [J]. OPTIKA I SPEKTROSKOPIYA, 1982, 52 (06): : 1046 - 1051
  • [10] UNAMBIGUOUS DETERMINATION OF OPTICAL-CONSTANTS OF ABSORBING FILMS BY REFLECTANCE AND TRANSMITTANCE MEASUREMENTS
    MCPHEDRAN, RC
    BOTTEN, LC
    MCKENZIE, DR
    NETTERFIELD, RP
    [J]. APPLIED OPTICS, 1984, 23 (08): : 1197 - 1205
12345