THE MEASUREMENT OF THE ELECTRICAL RESISTIVITY OF SILICON

被引：1
|
作者：
CREAMER, RH
机构：
来源：
BRITISH JOURNAL OF APPLIED PHYSICS | 1956年 / 7卷 / 04期
关键词：
D O I：
10.1088/0508-3443/7/4/305
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：149 / 150
页数：2
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