ANALYTICAL TECHNIQUES WITH THE AUGER SCANNING ELECTRON-MICROSCOPE

被引：11

|

作者：

MOGAMI, A

机构：

来源：

THIN SOLID FILMS | 1979年 / 57卷 / 01期

关键词：

D O I：

10.1016/0040-6090(79)90418-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：127 / 139

页数：13

相关论文

共 50 条

[1] AUGER-ELECTRON SPECTROSCOPY IN SCANNING ELECTRON-MICROSCOPE
WALDROP, JR
MARCUS, HL
JOURNAL OF TESTING AND EVALUATION, 1973, 1 (03) : 194 - 201
[2] SCANNING ELECTRON-MICROSCOPE AS AN ANALYTICAL TOOL
PEASE, DE
DAO, J
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1974, NS21 (01) : 788 - 793
[3] THE SCANNING ELECTRON-MICROSCOPE AND ELECTRON MICRO-PROBE AS COMPLEMENTARY ANALYTICAL TECHNIQUES
SPAULDING, RF
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 182 (AUG): : 6 - ACSC
[4] REPLICA TECHNIQUES FOR SCANNING ELECTRON-MICROSCOPE
NEVILLE, G
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (08): : 743 - &
[5] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
WATANABE, T
DENKI KAGAKU, 1986, 54 (08): : 667 - 670
[6] SIMPLE UHV-AUGER-SCANNING TRANSMISSION ELECTRON-MICROSCOPE
WIEDMANN, P
SEILER, H
OPTIK, 1977, 49 (03): : 295 - 300
[7] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE
MIYAUCHI, K
WATANABE, T
KUBOZOE, M
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
[8] SCANNING-TRANSMISSION ELECTRON-MICROSCOPE AS AN ANALYTICAL INSTRUMENT
ISAACSON, M
JOM-JOURNAL OF METALS, 1976, 28 (12): : A18 - A18
[9] SCANNING ELECTRON-MICROSCOPE
EVERHART, TE
HAYES, TL
SCIENTIFIC AMERICAN, 1972, 226 (01) : 54 - &
[10] SCANNING ELECTRON-MICROSCOPE
NEELAKANTAN, P
COLOURAGE, 1980, 27 (07): : 5 - &

← 1 2 3 4 5 →