FAILURE RATE PREDICTION OF OPTICAL SEMICONDUCTOR-DEVICES

被引：3
|
作者：
SUDO, H
NAKANO, Y
机构：
来源：
MICROELECTRONICS RELIABILITY | 1985年 / 25卷 / 03期
关键词：
D O I：
10.1016/0026-2714(85)90202-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：525 / 540
页数：16
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