ECONOMIC-EFFECTS IN DESIGN AND TEST

被引：7
|
作者：
DEAR, ID
DISLIS, C
AMBLER, AP
DICK, J
机构：
[1] BRUNEL UNIV,DEPT ELECT ENGN,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
[2] BRUNEL UNIV,RACAL REDAC CHAIR,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
[3] SIEMENS AG,NIXDORFS CAE SOFTWARE DEV LABS,MUNICH,GERMANY
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1991年 / 8卷 / 04期
关键词：
D O I：
10.1109/54.107206
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Because of misconceptions and myths about the cost of test, many devices and systems ore inadequately tested. Focusing on application-specific ICs, the authors discuss the economics of test and show how economic analysis leads to test that pays back. They also present the EVEREST test strategy planner, a design tool that aids in the selection of DFT structures during ASIC design, using cost as a primary selection parameter.
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页码：64 / 77
页数：14
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