共 50 条
- [4] PIXE MICRO-PROBE ANALYSIS WITH THE HEIDELBERG PROTON MICRO-PROBE [J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3): : 141 - 148
- [6] MELTING OF CEMENTS FOR QUANTITATIVE ELECTRON MICRO-PROBE ANALYSIS [J]. ANALUSIS, 1982, 10 (06) : 284 - 287
- [7] ION BEAM-TARGET INTERACTIONS IN ION MICRO-PROBE ANALYSIS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 42 (1-2): : 51 - 61
- [8] MATRIX EFFECTS IN SECONDARY ION EMISSION - QUANTITATIVE-ANALYSIS OF SILICATES [J]. JOURNAL DE PHYSIQUE LETTRES, 1980, 41 (10): : L247 - L250
- [9] MATRIX EFFECTS IN SECONDARY ION EMISSION - QUANTITATIVE-ANALYSIS OF SILICATES [J]. COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1980, 290 (03): : 51 - 54
- [10] LINEAR VARIATION OF THE SECONDARY ION YIELD - QUANTITATIVE-ANALYSIS OF THE SILICATES [J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1980, 5 (02): : 231 - 242