PROBE DESIGN EXTENDS ON-WAFER TESTING TO 120 GHZ

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作者：
LIU, SMJ
BOLL, GG
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MICROWAVES & RF | 1993年 / 32卷 / 06期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：104 / &
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