SNAP-BACK - A STABLE REGENERATIVE BREAKDOWN MODE OF MOS DEVICES

被引：22
|
作者：
OCHOA, A [1 ]
SEXTON, FW [1 ]
WROBEL, TF [1 ]
HASH, GL [1 ]
SOKEL, RJ [1 ]
机构：
[1] INMOS CORP,COLORADO SPRINGS,CO
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期
关键词：
D O I：
10.1109/TNS.1983.4333094
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：4127 / 4130
页数：4
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