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HIGH-PURITY INP AND THE ROLE OF HYDROGEN
被引:4
|作者:
GLEW, RW
ADAMS, AR
CROOKES, CG
GREENE, PD
HOLMES, SN
KITCHING, SA
KLIPSTEIN, PC
LANCEFIELD, D
STRADLING, RA
WOOLLEY, RA
机构:
[1] STC Technology Ltd, Harlow
关键词:
19;
D O I:
10.1088/0268-1242/6/11/009
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Extremely high-purity InP has been grown in an atmospheric-pressure MOCVD reactor over the unusually large temperature range from 575-700-degrees-C. The apparent purity of the material was enhanced by the incorporation of atomic hydrogen. At 650-degrees-C, a temperature at which many device structures are grown, a 77 K electron mobility of 190 000 cm2 V-1 s-1 was obtained with an electron concentration of 1.6 x 10(14) cm-3. Removal of the hydrogen resulted in a decrease in the electron mobility and an increase in the electron concentration. After removal of the atomic hydrogen, samples grown at 650-degrees-C had 77 K electron mobilities of approximately 140 000 cm2 V-1 s-1 at an electron concentration of approximately 3.6 x 10(14) cm-3. Analysis of the temperature dependence of the electron mobility indicates that the atomic hydrogen, which comes from the thermal decomposition of the phosphine on epilayer cool-down, neutralises both donors and acceptors. The incorporation and removal of hydrogen does not affect the optical characteristics of the material as measured by photoluminescence and far-infrared photoconductivity.
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页码:1088 / 1092
页数:5
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