APPLICATIONS OF FREQUENCY SPECTRA MEASUREMENTS TO METROLOGY

被引：0
|
作者：
MONGEON, RJ [1 ]
机构：
[1] UNITED TECHNOL RES CTR,E HARTFORD,CT 06108
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1976年 / 66卷 / 10期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：1129 / 1129
页数：1
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