THIN-LAYER SQUARE-WAVE VOLTAMMETRY AND SQUARE-WAVE STRIPPING VOLTAMMETRY

被引：14
|
作者：
KUMAR, V [1 ]
HEINEMAN, WR [1 ]
机构：
[1] UNIV CINCINNATI,DEPT CHEM,CINCINNATI,OH 45221
来源：
ANALYTICAL CHEMISTRY | 1987年 / 59卷 / 06期
关键词：
D O I：
10.1021/ac00133a012
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：842 / 846
页数：5
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