DEFORMATION AND FRACTURE OF NIAL SINGLE-CRYSTALS TESTED IN TORSION

被引：4
|
作者：
BLANKENSHIP, CP
LARSEN, M
SUTLLIFF, JA
机构：
[1] General Electric Corporate Research and Development, Schenectady
来源：
ACTA METALLURGICA ET MATERIALIA | 1995年 / 43卷 / 04期
关键词：
D O I：
10.1016/0956-7151(94)00338-I
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Binary NiAl single crystals were tested in torsion. [001] oriented samples exhibited lower shear strength and higher shear strain to failure compared to [110] oriented samples. Transmission electron microscopy revealed an increasing dislocation density from the center of the sample to the outer surface. Most dislocations that were analyzed were of the b = [100] type, however, some [110] type dislocations were observed in the [110] oriented samples. Electron backscatter patterns and tilting experiments were used to determine the crystallography of two types of facets on failed samples: those near {112} and those similar to 10 degrees away from {001}.
引用
收藏
页码：1549 / 1558
页数：10
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