IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST

被引：70

|

作者：

EISENHANDLER, CB

SIEGEL, BM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1966年 / 37卷 / 04期

关键词：

D O I：

10.1063/1.1708575

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1613 / +

页数：1

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